Variation in the In-Plane Penetration Depth lambda(ab) as a Function of Doping in La(2-x)Sr(x)CuO(4+/-delta) Thin Films on SrTiO(3): Implications for the Overdoped State

        Normal-state properties, such as the resistivity rho(ab) and the Hall coefficient R(H), structural properties, such as the c-axis and in-plane lattice parameters, and superconductive properties, such as the critical temperature Tc, the penetration depth lambda(ab) and the thermal activation energy for flux flow Delta U, are reported for c-axis
        La(2-x)Sr(x)CuO(4+/-delta) films. These parameters have been measured as a function of doping in the range from heavily underdoped to heavily overdoped. The structural data indicate a 0.3% compression of the c-axis parameter and a corresponding 0.3% expansion of the in-plane lattice parameters as compared to bulk values, which explains the overall reduced critical temperature of these thin films. As the dopant content is increased, maximum values for Tc, Delta U and lambda(ab)**-1 are observed close to optimum doping, while R(H) and rho(ab) decrease monotonically.

By: J. P. Locquet, Y. Jaccard (Univ. de Neuchatel, Switz.), A. Cretton (Univ. de Geneve, Switz.), E. J. Williams (Univ. de Geneve, Switz.), E. Machler, T. Schneider, O. Fischer (Univ. de Geneve, Switz.) and P. Martinoli (Univ. de Neuchatel, Switz.)

Published in: Physical Review. B. Condensed Matter, volume 54, (no 10), pages 7481-7488. in 1994

Please obtain a copy of this paper from your local library. IBM cannot distribute this paper externally.

Questions about this service can be mailed to .