Hole Confinement and Its Impact On Low-Frequency Noise In SiGe On Sapphire pFETS

        No Abstract Available.

By: Suraj J. Mathew, Guofu Niu, Wadad B. Dubbelday, John D. Cressler, John A. Ott, Jack O. Chu, Patricia M. Mooney, Karen L. Kavanagh, Bernard S. Meyerson, Isaac Lagnado

Published in: RC20951 in 1997

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